X-ray Diffraction Procedures for Polycrystalline and Amorphous Materials, 2ndedn. Bone diagenesis: an overview of processes. The Basics of Crystallography and Diffraction, 3rdedn. X-ray Diffraction in Crystals, Imperfect Crystals,and Amorphous Bodies. Disputed discovery: the beginnings of X-ray diffraction in crystals in 1912 and its repercussions. Cambridge: Royal Society of Chemistry.Įckert, M., 2012. Characterization and calibration of the CheMin mineralogical instrument on MarsScience Laboratory. Applied Physics A, 110(2), 371–377.īlake, D., Vaniman, D., Achilles, C., Anderson, R., Bish, D., Bristow, T., Chen, C., Chipera, S., Crisp, J., Des Marais, D., Downs, R.T., Farmer, J., Feldman, S., Fonda, M., Gailhanou,M., Ma, H., Ming, D.W., Morris, R.V., Sarrazin, P., Stolper, E., Treiman, A., and Yen, A., 2012. New milarite/osumilite-type phase formed during ancient glazing of an Egyptian scarab. Crystals and phase transitions in protohistoric glass materials. Bolzano: Folio Verlag, pp.9–22.Īrtioli, G., Angelini, I., and Polla, A., 2008. In Fleckinger, A.(ed.), Die Gletschermumieaus der Kupferzeit: 2.Neue Forschungsergebnisse zum Mann aus dem Eis/La mummia dell’età del rame: 2.Nuove ricerche sull’uomo venuto dal ghiaccio. Crystallographic texture analysis of the Icemanand coeval copper axes by non-invasive neutron powderdiffraction. Rendiconti Lincei, Scienze Fisiche eNaturali, 24(Suppl. Science for the cultural heritage: the contribution of X-ray diffraction. Oxford: Oxford University Press.Īrtioli, G., 2013. Scientific Methods and Cultural Heritage: An Introduction to the Application of Materials Science to Archaeometry and Conservation Science. Crystallographic texture analysis of archaeological metals: interpretation of manufacturing techniques. The coordinated use of synchrotron spectroelectrochemistry for corrosion studies on heritage metals. In addition, both single peak and whole pattern methodologies have been assessed.Īll methods produce reasonable results, however the study highlights some of the strengths, deficiencies and applicability of each of the approaches.Adriaens, A., and Dowsett, M., 2010. Laboratory-based, X-ray diffraction data from a suite of synthetic samples, with amorphous content rangäing from 0.0 to 50 wt%, has been analysed using both direct (in which the contribution of the amorphous component to the pattern is used to obtain an estimate of concentration) and indirect (where the absolute abundances of the crystalline components are used to estimate the amorphous content by difference) methodologies. The methodology of a number of different approaches to the determination of amorphous content via X-ray diffraction and an assessment of their performance, is described. Awareness of this issue is increasing in importance with the advent of nanotechnology and the blurring of the boundaries between amorphous and crystalline species. Traditional phase quantification via the Rietveld method fails to take into account the occurrence of amorphous material in the sample and without careful attention on behalf of the operator its presence would remain undetected. The presence of amorphous materials in crystalline samples is an increasingly important issue for diffractionists.
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